A telecommunications line interface test system architecture

Abstract

The authors present new test techniques which have been used to develop a high-quality, cost-efficient test module suitable for high-volume testing of T1/PCM-39 line interface devices. This test module is capable of fully testing the key parameters of sophisticated line interface driver/receivers (jitter tolerance, jitter attenuation, and pulse-shape template conformance). Using this module, a 75% reduction in test time was achieved. The test system is being used for production testing of ISDN (integrated services digital network) primary-rate line interface devices.<>