Temperature- and moisture-induced warpages of COG package with non-conductive paste adhesive

M. Tsai, C. Huang, C. Chiang, W. Chen, S. Yang
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引用次数: 4

Abstract

The use of non-conductive paste (NCP) or film (NCF) adhesives to replace the ACF (anisotropic conductive film) in COG (chip on glass) packages may be a possible solution for the low cost and finer bump pitch application to the LCDs (liquid crystal displays). However, when the NCP is applied, reliability issues, such as excessive warpage, interfacial delamination, and increasing contact resistance of bumps, occur in the COG packages. The goal of this paper is to experimentally and numerically study the warpage of NCP-bonded COG packages with and without fillet after cured in the chamber with 150degC for 2 hrs, under thermal and moisture loads. Twyman-Green interferometry is used for measuring the warpages (out-of-plane deformations) of the COG packages due to such loads. Three-dimensional finite element method (FEM) is used for calculating the warpage and the results are compared with experimental observations in order to provide an insight to it in terms of mechanics. The full-field out-of-plane deformations (warpage) of the COG packages with and without fillet have been experimentally measured under thermal cycling and moisture loading. The results show that, right after manufacturing, the much apparently concave-up-shape warpages are found at the COG packages with fillet, but slightly concave-down shapes for those without fillet. And the warpages decrease with the heating temperature increasing. The warpages (fringe patterns) of the COG package, determined from experiment and FEM, are quite consistent for case with fillet or without fillet. Prior to investigating the moisture effect on warpages of the COG packages, the moisture-induced strain of the NCP at the condition of 29degC /85%RH for 12 hrs has been obtained to be epsivm = 0.3 % by testing NCP/silicon bi-material plate with a combination of Twyman-Green experiment and Timoshenko's bi-material theory. This strain value has been incorporated into the FEM analysis, and the obtained warpage distributions of COG packages with and without fillet are compared with those from Twyman-Green experiment. It is shown that moisture-absorption expansion strain leads to dramatically reduce the warpage of the COG package with fillet, but not for that without fillet
温度和水分引起的COG包装翘曲与不导电的粘贴粘合剂
采用非导电浆料(NCP)或薄膜(NCF)胶粘剂代替玻璃上芯片(COG)封装中的ACF(各向异性导电膜)可能是一种低成本和更细凹凸间距应用于lcd(液晶显示器)的可能解决方案。然而,当应用NCP时,COG封装中会出现可靠性问题,例如过度翘曲,界面分层和凸起接触电阻增加。本文的目的是通过实验和数值研究在150℃的室内固化2小时后,带圆角和不带圆角的ncp粘合COG封装在热和湿载荷下的翘曲。Twyman-Green干涉测量法用于测量由于这种载荷引起的COG封装的翘曲(面外变形)。采用三维有限元法计算翘曲,并将计算结果与实验结果进行比较,以期从力学角度对翘曲现象有所认识。实验测量了带圆角和不带圆角的COG封装在热循环和湿载荷下的全场面外变形(翘曲)。结果表明,在制造后,在有圆角的COG包装上发现了明显的凹形翘曲,而在没有圆角的COG包装上发现了轻微的凹形翘曲。翘曲量随加热温度的升高而减小。通过实验和有限元分析确定的COG包的翘曲(条纹图案)在有圆角和没有圆角的情况下是相当一致的。在研究水分对COG封装变形的影响之前,结合Twyman-Green实验和Timoshenko双材料理论,通过对NCP/硅双材料板的测试,得到了NCP在29℃/85%RH条件下12 h的湿致应变epsivm = 0.3%。将该应变值纳入有限元分析,并与Twyman-Green实验结果进行了比较。结果表明,吸湿膨胀应变能显著减小带圆角的COG包件的翘曲量,而不带圆角的COG包件的翘曲量则不能显著减小
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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