Capturing interface toughness parameters from shear testing using different fracture mechanics approaches

J. Auersperg, R. Dudek, B. Bramer, R. Pufall, B. Seiler, B. Michel
{"title":"Capturing interface toughness parameters from shear testing using different fracture mechanics approaches","authors":"J. Auersperg, R. Dudek, B. Bramer, R. Pufall, B. Seiler, B. Michel","doi":"10.1109/EPTC.2012.6507129","DOIUrl":null,"url":null,"abstract":"Simple adhesion tests like the pull-out test or the button shear tests have been used in industry for decades. They offer a great potential for comparison of different molding compounds, encapsulants, or adhesives on different types of substrates with or without surface treatment. However, for theoretical prediction purposes, interface fracture mechanics parameters are needed. Quantitative evaluations of the test applied to molding compound (MC)-button on Cu-leadframe by different fracture- and damage mechanical approaches are the subjects of the paper. Defect tolerant methodologies like the \"virtual crack closure technique\" (VCCT) and the J-inter-action integral approach, which consider the interface initially delaminated, are compared to the damage methodology “cohesive zone modelling (CZM)”, which needs no initial crack and can track the delamination progress. Calculated fracture parameters, in particular the energy release rates and mode mixity are compared. Effects on these parameters are discussed for different button shapes. In-situ tracking of dela-mination progress for a cubic button is shown using the optical correlation technique microDAC.","PeriodicalId":431312,"journal":{"name":"2012 IEEE 14th Electronics Packaging Technology Conference (EPTC)","volume":"50 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 IEEE 14th Electronics Packaging Technology Conference (EPTC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPTC.2012.6507129","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3

Abstract

Simple adhesion tests like the pull-out test or the button shear tests have been used in industry for decades. They offer a great potential for comparison of different molding compounds, encapsulants, or adhesives on different types of substrates with or without surface treatment. However, for theoretical prediction purposes, interface fracture mechanics parameters are needed. Quantitative evaluations of the test applied to molding compound (MC)-button on Cu-leadframe by different fracture- and damage mechanical approaches are the subjects of the paper. Defect tolerant methodologies like the "virtual crack closure technique" (VCCT) and the J-inter-action integral approach, which consider the interface initially delaminated, are compared to the damage methodology “cohesive zone modelling (CZM)”, which needs no initial crack and can track the delamination progress. Calculated fracture parameters, in particular the energy release rates and mode mixity are compared. Effects on these parameters are discussed for different button shapes. In-situ tracking of dela-mination progress for a cubic button is shown using the optical correlation technique microDAC.
利用不同的断裂力学方法从剪切试验中获取界面韧性参数
简单的附着力测试,如拔出测试或按钮剪切测试已经在工业中使用了几十年。它们为在不同类型的基材上进行表面处理或不进行表面处理的不同成型化合物、封装剂或粘合剂的比较提供了巨大的潜力。然而,为了进行理论预测,需要界面断裂力学参数。本文采用不同的断裂和损伤力学方法对铜引线框架上模合料(MC)扣的试验结果进行了定量评价。将考虑界面初始分层的“虚拟裂纹闭合技术”(VCCT)和j -互作用积分法等容错方法与不需要初始裂纹且可以跟踪分层过程的损伤方法“内聚区建模”(CZM)进行了比较。计算的断裂参数,特别是能量释放率和模式混合进行了比较。讨论了不同按钮形状对这些参数的影响。利用光学相关技术microDAC对一个立方体按钮的分层过程进行了原位跟踪。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信