TAC: Testing time reduction for digitally-calibrated designs

Hsiu-Ming Chang, K. Cheng
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引用次数: 5

Abstract

For digitally-calibrated analog, mixed-signal and radio-frequency (AMS/RF) circuits, it is desirable to stop the calibration process as soon as it reaches convergence. Such a strategy can avoid wasting unnecessary calibration time and ensure high calibration quality during production testing. However, due to the lack of systematic methods for convergence detection, existing digitally-calibrated designs simply allot a fixed and sufficiently long period of time for calibration. In this paper, we propose a method to reduce testing time by terminating calibration at convergence for circuits that employ the least-mean-square (LMS) algorithm for built-in calibration. We observe the fluctuation range of the tap coefficients in the digital calibration unit to determine whether the convergence criteria are met and subsequently terminate the calibration process. We conduct two case studies - a digitally-calibrated pipelined ADC and a digitally-calibrated image-reject receiver - to demonstrate the generality and effectiveness of our proposed method. In comparison with the existing termination policy, our proposed method, on average, can reduce the calibration time by 70%.
TAC:减少数字校准设计的测试时间
对于数字校准的模拟,混合信号和射频(AMS/RF)电路,希望在达到收敛时立即停止校准过程。该策略可避免浪费不必要的校准时间,确保生产测试过程中的高校准质量。然而,由于缺乏系统的收敛检测方法,现有的数字校准设计只是简单地分配一个固定且足够长的校准时间。在本文中,我们提出了一种方法,通过在收敛处终止使用最小均方(LMS)算法进行内置校准的电路的校准来减少测试时间。我们观察数字校准单元中抽头系数的波动范围,以确定是否满足收敛准则,随后终止校准过程。我们进行了两个案例研究-数字校准的流水线ADC和数字校准的图像抑制接收器-来证明我们提出的方法的通用性和有效性。与现有的终止策略相比,我们提出的方法平均可以减少70%的校准时间。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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