Unifying scan compression

2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) Pub Date : 2014-11-24 DOI:10.1109/DFT.2014.6962079

Swapnil Bahl, Shrey Rungta, Shray Khullar, R. Kapur, A. Chandra, S. Talluto, Pramod Notiyath, Ajay Rajagopalan

引用次数: 4

Abstract

STMicroelectronics has been using scan compression for many years. With the vast variety of designs and the size of the company it is important to deploy an easy to use solution that works for all the conditions. Today we support many different compression schemes DFTMAX, DFTMAX Xtol, Serializer. Each of these solutions is strong in a segment of the designs. DFTMAX Ultra has a technology that provides a single solution for all needs. In this paper we discuss the variety of design scenarios seen in ST from the point of scan compression. Results of DFTMAX Ultra are then presented to show that it is a viable unified solution.

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统一扫描压缩

意法半导体多年来一直在使用扫描压缩技术。由于设计的多样性和公司的规模，重要的是部署一个易于使用的解决方案，适用于所有条件。今天我们支持许多不同的压缩方案DFTMAX, DFTMAX Xtol, Serializer。这些解决方案在设计的某个部分都很强大。DFTMAX Ultra拥有一种技术，可为所有需求提供单一解决方案。在本文中，我们从扫描压缩的角度讨论了在ST中看到的各种设计方案。然后给出了DFTMAX Ultra的结果，表明它是一种可行的统一解决方案。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

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