A sampling technique for diagnostic fault simulation

Abstract

The quality of diagnostic test sets (DTS) are determined using diagnostic fault simulation (DFS). We propose a novel approximation algorithm, called "EC/IC Sampling", for DFS. It samples the set of equivalence classes (EC)/indistinguishable classes (IC). An approach to sample ECs/ICs implicitly, without explicitly enumerating the set of ECs/ICs, is presented. Experimental evaluation of the proposed technique show it to be very effective.