Characterization and reliability of electrolytic capacitors exposed to halogenated solvents

R. Masaitis, A. Muller, R. Opila, L. Psota-Kelty, S. Daoud
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引用次数: 5

Abstract

To determine the effect of exposure to halogenated solvents on electrolytic-capacitor lifetime, populations of these capacitors were exposed to accelerated testing. It is shown that halogenated solvents cause electrolytic capacitors to fail open at the anode. The electrolytic corrosion, which dissolves the passivating oxide layer on the anodically biased aluminum and exposes a clean aluminum surface, is the rate limiting step in the failures. Halogenated solvents then readily react with the aluminum surface and erode the electrode until the solvent is consumed. The increase in pressure inside the capacitor can cause the capacitor to vent, further accelerating failure. Accelerated life testing of one of the capacitor types considered suggests that it may fail at normal operating conditions in 2-3 years. Monitoring of capacitor characteristics during the accelerated life test shows that changes in these characteristic parameters cannot be used to predict failure.<>
暴露于卤化溶剂的电解电容器的特性和可靠性
为了确定暴露于卤化溶剂对电解电容器寿命的影响,这些电容器的群体暴露于加速测试中。结果表明,卤化溶剂导致电解电容器在阳极处不能打开。电解腐蚀溶解阳极偏置铝表面的钝化氧化层,暴露出干净的铝表面,是失效的限速步骤。卤化溶剂然后很容易与铝表面反应并侵蚀电极,直到溶剂被消耗。电容器内部压力的增加会导致电容器排气,进一步加速失效。其中一种电容器类型的加速寿命测试表明,在正常工作条件下,它可能在2-3年内失效。在加速寿命试验中对电容器特性的监测表明,这些特性参数的变化不能用来预测失效
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