{"title":"Transient latchup in power analog circuits","authors":"V. Vashchenko, D. LaFonteese, A. Concannon","doi":"10.1109/IRPS.2011.5784508","DOIUrl":null,"url":null,"abstract":"Two cases of transient latchup specific to power management analog integrated circuit design are described and analyzed experimentally. The representative case studies include the interaction of a power array and ESD clamp and the interaction of two high voltage ESD clamps","PeriodicalId":242672,"journal":{"name":"2011 International Reliability Physics Symposium","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-04-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 International Reliability Physics Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IRPS.2011.5784508","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
Two cases of transient latchup specific to power management analog integrated circuit design are described and analyzed experimentally. The representative case studies include the interaction of a power array and ESD clamp and the interaction of two high voltage ESD clamps