{"title":"Interface properties of surface activated bonded CNT bumps and Au substrate","authors":"M. Fujino, T. Suga","doi":"10.23919/LTB-3D.2017.7947450","DOIUrl":null,"url":null,"abstract":"CNT bumps were bonded to Au substrate by surface activated bonding with/without Au sputtering, and the interconnect resistance was compared. As result, the Au sputtered CNT bumps can reduce the interconnect resistance because of enlarging contact area of CNT/Au, and also their conjugation.","PeriodicalId":183993,"journal":{"name":"2017 5th International Workshop on Low Temperature Bonding for 3D Integration (LTB-3D)","volume":"6 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 5th International Workshop on Low Temperature Bonding for 3D Integration (LTB-3D)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/LTB-3D.2017.7947450","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
CNT bumps were bonded to Au substrate by surface activated bonding with/without Au sputtering, and the interconnect resistance was compared. As result, the Au sputtered CNT bumps can reduce the interconnect resistance because of enlarging contact area of CNT/Au, and also their conjugation.