{"title":"Transmission Electron Microscopy (STEM and TEM)","authors":"E. Grimley, J. Lebeau","doi":"10.1016/B978-0-08-102430-0.00015-2","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":401168,"journal":{"name":"Ferroelectricity in Doped Hafnium Oxide: Materials, Properties and Devices","volume":"71 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Ferroelectricity in Doped Hafnium Oxide: Materials, Properties and Devices","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1016/B978-0-08-102430-0.00015-2","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}