Strategies to determine failure mechanism of devices that recovered during analysis

L. Tan, C. H. Liew, Akeel Nazakat, Jethro Tan, W. F. Kho
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Abstract

Occurrences of failure recovery in the course of failure analysis work are not uncommon. Despite this, successful identification of the failure mechanism is still possible in some cases based on available data up to the point of failure recovery, circuit layout knowledge and a combination of a few conventional failure analysis techniques.
确定在分析过程中恢复的设备故障机制的策略
在故障分析工作中,故障恢复的发生并不少见。尽管如此,在某些情况下,基于故障恢复点的可用数据、电路布局知识和几种传统故障分析技术的结合,仍然有可能成功识别故障机制。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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