{"title":"A flexible test structure evaluation system for reliability data analysis","authors":"M. Mori, Y. Kuriyama, N. Shiono","doi":"10.1109/ICMTS.1993.292921","DOIUrl":null,"url":null,"abstract":"A test structure evaluation system with powerful data processing capability is developed for effective measurement data acquisition and reliability data analysis. Data analysis can be performed quickly with a unified data format customized to reliability data. A unified, flexible system is achieved by networking discrete measuring systems and by generalizing common routines in measurement programs.<<ETX>>","PeriodicalId":123048,"journal":{"name":"ICMTS 93 Proceedings of the 1993 International Conference on Microelectronic Test Structures","volume":"58 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-03-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"ICMTS 93 Proceedings of the 1993 International Conference on Microelectronic Test Structures","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICMTS.1993.292921","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
A test structure evaluation system with powerful data processing capability is developed for effective measurement data acquisition and reliability data analysis. Data analysis can be performed quickly with a unified data format customized to reliability data. A unified, flexible system is achieved by networking discrete measuring systems and by generalizing common routines in measurement programs.<>