{"title":"Online Fault Detection in ReRAM-Based Computing Systems by Monitoring Dynamic Power Consumption","authors":"Mengyun Liu, K. Chakrabarty","doi":"10.1109/ITC44778.2020.9325259","DOIUrl":null,"url":null,"abstract":"A ReRAM-based computing system (RCS) provides an energy-efficient hardware implementation of vector-matrix multiplication for machine-learning hardware. However, it is vulnerable to faults due to the immature ReRAM fabrication process. We propose an efficient online fault-detection method for RCS; the proposed method monitors the dynamic power consumption of each ReRAM crossbar and determines the occurrence of faults when a changepoint is detected in the monitored power-consumption time series. In order to estimate the percentage of faulty cells in a faulty ReRAM crossbar, we compute statistical features before and after the changepoint and train a predictive model using machine-learning techniques. In this way, the computationally expensive fault localization and error-recovery steps are carried out only when a high fault rate is estimated. Simulation results show that, with the fault-detection method and the predictive model, the test time is significantly reduced while high classification accuracy for the MNIST and CIFAR-10 datasets using RCS can still be ensured.","PeriodicalId":251504,"journal":{"name":"2020 IEEE International Test Conference (ITC)","volume":"33 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE International Test Conference (ITC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ITC44778.2020.9325259","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
A ReRAM-based computing system (RCS) provides an energy-efficient hardware implementation of vector-matrix multiplication for machine-learning hardware. However, it is vulnerable to faults due to the immature ReRAM fabrication process. We propose an efficient online fault-detection method for RCS; the proposed method monitors the dynamic power consumption of each ReRAM crossbar and determines the occurrence of faults when a changepoint is detected in the monitored power-consumption time series. In order to estimate the percentage of faulty cells in a faulty ReRAM crossbar, we compute statistical features before and after the changepoint and train a predictive model using machine-learning techniques. In this way, the computationally expensive fault localization and error-recovery steps are carried out only when a high fault rate is estimated. Simulation results show that, with the fault-detection method and the predictive model, the test time is significantly reduced while high classification accuracy for the MNIST and CIFAR-10 datasets using RCS can still be ensured.