Test Point Selections for a Programmable Gain Amplifier Using NIST and Wavelet Transform Methods

Abstract

Test point selections for a programmable gain amplifier (PGA) using the National Institute of Standard (NIST) and wavelet transform methods are investigated. Although the wavelet transform method is an efficient method in test point selection for many mixed-signal devices, for a PGA with 31 input steps, the NIST method is shown to be more accurate in predicting the output gain responses than the wavelet transform method.