{"title":"Single-Event Effects Test Results of the Intersil ISL73141SEH Precision SAR ADC","authors":"J. Harris, L. Pearce, N. V. van Vonno, E. Thomson","doi":"10.1109/REDW51883.2020.9325849","DOIUrl":null,"url":null,"abstract":"We report the results of destructive and nondestructive single-event effects (SEE) testing of the Intersil ISL73141SEH 14-bit 750/1000ksps precision SAR ADC.","PeriodicalId":127384,"journal":{"name":"2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)","volume":"24 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/REDW51883.2020.9325849","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
We report the results of destructive and nondestructive single-event effects (SEE) testing of the Intersil ISL73141SEH 14-bit 750/1000ksps precision SAR ADC.