Volume and quality impacts on reliability: a new game for GaAs

Abstract

This work advances the knowledge of GaAs reliability by showing high temperature lifetesting is NOT the only game in town. Other accelerated tests are more effective in generating failures-especially failures that are likely to occur in typical use conditions. This work also demonstrates that emphasis on volume and quality aspects of semiconductor manufacturing will result in improved reliability results. Communication with high volume customers and larger sample sizes are offered as methods for finding "real" failure mechanisms.