M. Kobayashi, Fei Mo, Jiawen Xiang, Jixuan Wu, T. Saraya, T. Hiramoto
{"title":"Technology Challenge and Opportunity of HfO2-based FeFET Memory","authors":"M. Kobayashi, Fei Mo, Jiawen Xiang, Jixuan Wu, T. Saraya, T. Hiramoto","doi":"10.7567/ssdm.2021.b-6-01","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":185590,"journal":{"name":"Extended Abstracts of the 2021 International Conference on Solid State Devices and Materials","volume":"11 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-09-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Extended Abstracts of the 2021 International Conference on Solid State Devices and Materials","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.7567/ssdm.2021.b-6-01","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}