On the diagnosis of programmable interconnect systems: Theory and application

Wei-Kang Huang, Xiao-Tao Chen, F. Lombardi
{"title":"On the diagnosis of programmable interconnect systems: Theory and application","authors":"Wei-Kang Huang, Xiao-Tao Chen, F. Lombardi","doi":"10.1109/VTEST.1996.510859","DOIUrl":null,"url":null,"abstract":"This paper considers the diagnosis of field programmable interconnect systems (FPIS) in which programmable grids made of switches are included. For this type of interconnects, the number of times the grid must be programmed and the programming sequence of the switches an two of the most important figures of merit for full diagnosis (defection and location with no aliasing and confounding). A hierarchical approach to diagnosis is proposed and fully characterized. The application of this technique to commercially available FPIS such as FPGAs, is discussed. It is shown that the proposed diagnostic technique can be applied to the general purpose interconnect of the FPGAs in the 3000 family by Xilinx.","PeriodicalId":424579,"journal":{"name":"Proceedings of 14th VLSI Test Symposium","volume":"18 11 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1996-04-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"64","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of 14th VLSI Test Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTEST.1996.510859","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 64

Abstract

This paper considers the diagnosis of field programmable interconnect systems (FPIS) in which programmable grids made of switches are included. For this type of interconnects, the number of times the grid must be programmed and the programming sequence of the switches an two of the most important figures of merit for full diagnosis (defection and location with no aliasing and confounding). A hierarchical approach to diagnosis is proposed and fully characterized. The application of this technique to commercially available FPIS such as FPGAs, is discussed. It is shown that the proposed diagnostic technique can be applied to the general purpose interconnect of the FPGAs in the 3000 family by Xilinx.
可编程互联系统的诊断:理论与应用
本文研究了包含由开关构成的可编程网格的现场可编程互联系统(FPIS)的诊断。对于这种类型的互连,必须对电网的次数和开关的编程顺序进行编程,这是全面诊断的两个最重要的指标(无混叠和混淆的缺陷和位置)。提出了一种分层的诊断方法,并充分表征。讨论了该技术在fpga等商用FPIS中的应用。结果表明,所提出的诊断技术可应用于Xilinx 3000系列fpga的通用互连。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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