Degradation- and Failure Mode Analysis of III-V Nitride Devices

J. Tharian
{"title":"Degradation- and Failure Mode Analysis of III-V Nitride Devices","authors":"J. Tharian","doi":"10.1109/IPFA.2007.4378102","DOIUrl":null,"url":null,"abstract":"In this work, different failure modes and degradation mechanisms of AlInGaN LEDs were studied under different stress conditions. Another aim of this work was to develop a classification criteria of the LEDs based on initial RBL characteristics and enable the manufacturers ensure better reliability standards.","PeriodicalId":334987,"journal":{"name":"2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits","volume":"41 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-07-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IPFA.2007.4378102","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 9

Abstract

In this work, different failure modes and degradation mechanisms of AlInGaN LEDs were studied under different stress conditions. Another aim of this work was to develop a classification criteria of the LEDs based on initial RBL characteristics and enable the manufacturers ensure better reliability standards.
III-V型氮化物器件的退化与失效模式分析
本文研究了不同应力条件下AlInGaN led的不同失效模式和退化机制。这项工作的另一个目的是根据初始RBL特性制定led的分类标准,并使制造商能够确保更好的可靠性标准。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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