Comparison of high-frequency performance of quasi-SOI and conventional SOI power MOSFETs

Y. Hiraoka, S. Matsumoto, T. Sakai
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Abstract

We have compared the radio-frequency performance of quasi-SOI and conventional SOI power MOSFETs based on experimentally obtained results and numerical simulation. The quasi-SOI power MOSFET proved to be superior because the activation of the parasitic bipolar transistor was suppressed. We clarified, through a numerical simulation, that the parasitic bipolar effect causes harmonics generation. Especially, the third-order intermodulation distortion of the quasi-SOI device was about 15 dBc lower than that of the conventional SOI device under 2 GHz operation.
准SOI和传统SOI功率mosfet的高频性能比较
在实验结果和数值模拟的基础上,比较了准SOI和传统SOI功率mosfet的射频性能。准soi功率MOSFET被证明是优越的,因为寄生双极晶体管的激活被抑制。通过数值模拟,我们澄清了寄生双极效应导致谐波的产生。特别是在2ghz工作下,准SOI器件的三阶互调失真比传统SOI器件低约15 dBc。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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