Materials mechanics and mechanical reliability of flip chip assemblies on organic substrates

A. Schubert, R. Dudek, B. Michel, H. Reichl, H. Jiang
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引用次数: 33

Abstract

This paper demonstrates a combined approach of numerical analysis and experimental investigations to study the mechanical reliability of flip chip solder joints. The effect of various design parameters like bump geometry, "soft" and "hard" underfill, and used solder mask on the thermal fatigue life of solder joints is discussed. Since special attention has been directed towards Flip Chip on Board (FCOB) assemblies, constitutive properties of polymeric and solder materials are discussed in detail. The solder is modeled using a nonlinear constitutive law with time dependent (creep) and time independent plastic strains. Furthermore, material testing shows that the underfill and solder mask materials might be considered as linear viscoelastic with temperature time shift properties. Thermal mismatch between the materials assembled is often the main reason for thermally induced stresses. Thermal cycling (125/spl deg/C...-55/spl deg/C...125/spl deg/C) is therefore the load generally used in the 3D non-linear finite element analysis. Calculation results of the solder bump deformation due to temperature changes are accompanied by experimental deformation analysis. The used MicroDAC method is based on algorithms of local object tracking in images obtained from electron scanning microscopy. The measured deformation fields were utilized for proper materials selection and processing, as well as for verification of finite element analysis.
有机基板上倒装芯片组件的材料力学和机械可靠性
本文采用数值分析与实验研究相结合的方法研究倒装焊点的机械可靠性。讨论了凹凸几何形状、“软”和“硬”衬底以及所使用的阻焊剂等设计参数对焊点热疲劳寿命的影响。由于对板上倒装芯片(FCOB)组件的特别关注,因此详细讨论了聚合物和焊料的本构特性。焊料是使用非线性本构律与时间相关(蠕变)和时间无关的塑性应变建模。此外,材料测试表明,下填料和阻焊材料可以认为是具有温度时移特性的线性粘弹性材料。组装材料之间的热不匹配通常是热诱发应力的主要原因。热循环(125/spl℃…-55 / spl度/ C…125/spl℃)是三维非线性有限元分析中常用的荷载。温度变化对焊料凸点变形的计算结果与实验变形分析相结合。所使用的MicroDAC方法是基于电子扫描显微镜图像的局部目标跟踪算法。利用测量到的变形场进行适当的材料选择和加工,并对有限元分析进行验证。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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