Reliability, test, and I/sub DDQ/ measurements

Abstract

I/sub DDQ/ measurements are strongly identified with CMOS IC testing, however I/sub DDQ/ also has long term links to IC reliability. This paper overviews the association of reliability and I/sub DDQ/ testing. Three reliability topics are discussed: fundamental failure mechanisms, the relation of I/sub DDQ/ to burn-in, and the use of test data to predict reliability performance.