Enabling False Path Identification from RTL for Reducing Design and Test Futileness

Hiroshi Iwata, S. Ohtake, H. Fujiwara
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引用次数: 2

Abstract

Information on false paths is useful for design and test. Since identification of false paths at gate level is hard, several methods using high-level design information have been proposed. These methods are effective only if the correspondence between paths at register transfer level (RTL) and at gate level can be established. Until now, the correspondence has been established only by some restricted logic synthesis. In this paper, we propose a method for mapping RTL false paths to their corresponding gate level paths without such a specific logic synthesis.
从RTL中启用错误路径识别,以减少设计和测试的无效性
关于假路径的信息对设计和测试很有用。由于在门级很难识别假路径,因此提出了几种使用高级设计信息的方法。这些方法只有在寄存器传输层(RTL)和栅极层的路径能够建立对应关系的情况下才有效。到目前为止,只有一些有限的逻辑综合才能建立对应关系。在本文中,我们提出了一种将RTL假路径映射到相应的门电平路径的方法,而不需要这种特定的逻辑综合。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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