FALCON: Rapid statistical fault coverage estimation for complex designs

S. Mirkhani, J. Abraham, T. Vo, H. Jun, B. Eklow
{"title":"FALCON: Rapid statistical fault coverage estimation for complex designs","authors":"S. Mirkhani, J. Abraham, T. Vo, H. Jun, B. Eklow","doi":"10.1109/TEST.2012.6401584","DOIUrl":null,"url":null,"abstract":"FALCON (FAst fauLt COverage estimatioN) is a scalable method for fault grading which uses local fault simulations to estimate the fault coverage of a large system. The generality of this method makes it applicable for any modular design. Our analysis shows that the run time of our algorithm is related to the number of gates and the number of IOs in a module, while fault simulation run time is related to the total number of gates in the system. We have measured fault coverage for OR1200 and IVM processors and compared the results with fault simulation performed by a commercial tool. We have also compared our results with fault sampling. Our results show that for large designs FALCON is an order of magnitude faster compared with fault simulation. It also has a smaller error rate compared with fault sampling when the size of design under test grows.","PeriodicalId":353290,"journal":{"name":"2012 IEEE International Test Conference","volume":"11 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-11-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 IEEE International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.2012.6401584","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 8

Abstract

FALCON (FAst fauLt COverage estimatioN) is a scalable method for fault grading which uses local fault simulations to estimate the fault coverage of a large system. The generality of this method makes it applicable for any modular design. Our analysis shows that the run time of our algorithm is related to the number of gates and the number of IOs in a module, while fault simulation run time is related to the total number of gates in the system. We have measured fault coverage for OR1200 and IVM processors and compared the results with fault simulation performed by a commercial tool. We have also compared our results with fault sampling. Our results show that for large designs FALCON is an order of magnitude faster compared with fault simulation. It also has a smaller error rate compared with fault sampling when the size of design under test grows.
用于复杂设计的快速统计故障覆盖估计
FALCON(快速故障覆盖估计)是一种可扩展的故障分级方法,它利用局部故障模拟来估计大型系统的故障覆盖。该方法的通用性使其适用于任何模块化设计。我们的分析表明,我们的算法的运行时间与模块中门的数量和io的数量有关,而故障仿真的运行时间与系统中门的总数有关。我们测量了OR1200和IVM处理器的故障覆盖率,并将结果与商业工具执行的故障模拟进行了比较。我们还将我们的结果与故障抽样进行了比较。结果表明,对于大型设计,FALCON比故障模拟快一个数量级。当被测设计尺寸增大时,与故障抽样相比,该方法具有更小的错误率。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信