{"title":"Hard X-ray Photoemission Spectroscopy Study on Interface Dipole Modulation of HfO2/SiO2 MIM Device","authors":"Yoshiharu Kirihara, Ryota Tsujiguti, Reito Wada, Akira Yasui, Noriyuki Miyata, H. Nohira","doi":"10.7567/ssdm.2021.b-3-02","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":185590,"journal":{"name":"Extended Abstracts of the 2021 International Conference on Solid State Devices and Materials","volume":"71 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-09-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Extended Abstracts of the 2021 International Conference on Solid State Devices and Materials","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.7567/ssdm.2021.b-3-02","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}