A quantum thermomechanical modeling of band offsets and Schottky barriers of semiconductor heterostructures

H. Unlu
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Abstract

Using the extended universal tight binding model of semiconductors a new way of determining the band offsets and Schottky barrier heights in semiconductor heterostructures is presented. The band offsets and Schottky barriers are first determined by aligning the vacuum level, defined relative to valence band maximum and screened by optical dielectric constant of semiconductors, on both sides of heterojunction at zero temperature and standard pressure. The temperature, strain and pressure effects on band offsets and Schottky barriers are then obtained using the two statistical thermodynamic postulates: (i) the free electrons and holes are electrically charged weakly interacting quasichemical particles and (ii) the electron-hole pairs are generated by the charge transfer from bonding (valencelike) states to antibonding (conduction-like) states. Excellent agreement is obtained Between the model predictions and experiment for band offsets at interfaces between AlAs and GaAs and between HgTe and CdTe, as well as other heterojunctions and Schottky barriers.
半导体异质结构能带偏移和肖特基势垒的量子热力学模型
利用半导体的扩展通用紧密结合模型,提出了一种确定半导体异质结构中能带偏移和肖特基势垒高度的新方法。带偏移和肖特基势垒首先通过对准真空水平来确定,真空水平是相对于价带最大值来定义的,并通过半导体的光学介电常数来筛选,在零温度和标准压力下,在异质结两侧。然后利用两个统计热力学假设获得温度、应变和压力对能带偏移和肖特基势垒的影响:(i)自由电子和空穴是带电的弱相互作用准化学粒子;(ii)电子-空穴对是由电荷从成键(类价)态转移到反键(类电导)态产生的。在砷化镓和砷化镓界面、碲化镓和碲化镓界面以及其他异质结和肖特基势垒处,模型预测与实验结果非常吻合。
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