Multiple transient photocurrents coupled simulation based on AD8561 MACRO-SPICE Model

2021 4th International Conference on Radiation Effects of Electronic Devices (ICREED) Pub Date : 2021-05-26 DOI:10.1109/icreed52909.2021.9588740

Yang Li, Jianan Wei, Chaohui He, Weitao Yang, Yonghong Li, Yaxin Guo

{"title":"Multiple transient photocurrents coupled simulation based on AD8561 MACRO-SPICE Model","authors":"Yang Li, Jianan Wei, Chaohui He, Weitao Yang, Yonghong Li, Yaxin Guo","doi":"10.1109/icreed52909.2021.9588740","DOIUrl":null,"url":null,"abstract":"AD8561 (Analog Device Inc.) MACRO-SPICE model is used to investigate the coupled effects of multiple photocurrents generated by gamma pulse radiation in its Input and Output modules. Firstly, the test circuit is built to find sensitive devices according to previous studies. Besides, Gummel-Poon bipolar junction transistor (BJT) model including photocurrent generators implemented by the exponential current sources is adopted to replace the initial device model. Finally, the effects caused by each photocurrent and multiple photocurrents under different input states are simulated and analyzed. The simulation results indicate that there are competitive relationships among the multiple photocurrents generated in the input-stage bipolar transistors, even in a single bipolar transistor, and the relationship changes with the input state. The transient upset induced by photocurrents generated in the Input and Output modules have superimposed effects on the output ports, but the transient upset duration depends mainly on the Input module.","PeriodicalId":129675,"journal":{"name":"2021 4th International Conference on Radiation Effects of Electronic Devices (ICREED)","volume":"70 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 4th International Conference on Radiation Effects of Electronic Devices (ICREED)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/icreed52909.2021.9588740","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 2

Abstract

AD8561 (Analog Device Inc.) MACRO-SPICE model is used to investigate the coupled effects of multiple photocurrents generated by gamma pulse radiation in its Input and Output modules. Firstly, the test circuit is built to find sensitive devices according to previous studies. Besides, Gummel-Poon bipolar junction transistor (BJT) model including photocurrent generators implemented by the exponential current sources is adopted to replace the initial device model. Finally, the effects caused by each photocurrent and multiple photocurrents under different input states are simulated and analyzed. The simulation results indicate that there are competitive relationships among the multiple photocurrents generated in the input-stage bipolar transistors, even in a single bipolar transistor, and the relationship changes with the input state. The transient upset induced by photocurrents generated in the Input and Output modules have superimposed effects on the output ports, but the transient upset duration depends mainly on the Input module.

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基于AD8561宏spice模型的多瞬态光电流耦合仿真

采用AD8561 (Analog Device Inc.)的MACRO-SPICE模型研究了伽马脉冲辐射在其输入和输出模块中产生的多个光电流的耦合效应。首先，根据前人的研究，构建测试电路，寻找敏感器件。此外，采用Gummel-Poon双极结晶体管(bipolar junction transistor, BJT)模型，包括由指数电流源实现的光电流发生器来取代初始器件模型。最后，对不同输入状态下单个光电流和多个光电流的影响进行了仿真分析。仿真结果表明，即使在单个双极晶体管中，输入级双极晶体管中产生的多个光电流之间也存在竞争关系，并且这种关系随着输入状态的变化而变化。在输入和输出模块中产生的光电流引起的瞬态扰动对输出端口有叠加效应，但瞬态扰动持续时间主要取决于输入模块。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

2021 4th International Conference on Radiation Effects of Electronic Devices (ICREED)

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