Transient liquid phase (TLP) bonding using Sn/Ag multilayers for high temperature applications

N. Nobeen, R. Imade, B. Lee, Eric Jian Rong Phua, C. Wong, C. Gan, Zhong Chen
{"title":"Transient liquid phase (TLP) bonding using Sn/Ag multilayers for high temperature applications","authors":"N. Nobeen, R. Imade, B. Lee, Eric Jian Rong Phua, C. Wong, C. Gan, Zhong Chen","doi":"10.1109/EPTC.2013.6745799","DOIUrl":null,"url":null,"abstract":"With the growing demand for electronic devices operating in harsh conditions, the interconnect technology for packaging these devices remains an important area of focus to ensure reliable and stable functioning capabilities. Because these devices may experience temperatures that are higher than those encountered by consumer electronic products (e.g. for down-well tools in oil and gas drilling up to 200°C, automotive application up to 400°C), the die attach material has to withstand high temperatures generated during the device functioning, as well as external conditions without affecting the device performance. Conventional solders used in consumer electronic products have melting points lower than the maximum operating temperatures of harsh environment applications, and they are thus not appropriate for use. In contrast, metallurgical systems that can be bonded using the transient liquid phase (TLP) bonding process is a promising solution for high temperature electronic devices due to the following benefits, namely: (1) high quality bond can be formed, (2) a bond can be formed at a temperature much lower than the melting point of the resulting joint. In this paper, the feasibility to bond silver-tin (Ag-Sn) system using the TLP bonding process and use it as a die attach solution for high temperature electronic systems is reported. The advantages Ag-Sn system provides are low bonding temperature, low cost, high de-bonding temperature, and it is also one of the fast inter-diffusion couples. The influence of bonding parameters, such as bonding temperature, bonding force, on the quality of the TLP bond is discussed in order to develop a Ag-rich bond. The joints developed were inspected using X-ray and SEM/EDX, coupled with shear tests performed at room temperature to determine the mechanical strength of the joint. From the bonding studies, a Ag-Sn TLP bond was successfully developed. No occurrence of voids was found in the bonded area, and from the SEM/EDX analysis the joint was comprised of Ag and Ag3Sn intermetallic only, thereby achieving the desired Ag-rich joint. On the other hand, from the mechanical characterisation tests, the shear strength of the Ag-Sn bonded samples was observed to be higher than the minimum strength requirement for high temperature applications. The shear strength also increased with bonding pressure and temperature.","PeriodicalId":210691,"journal":{"name":"2013 IEEE 15th Electronics Packaging Technology Conference (EPTC 2013)","volume":"25 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 IEEE 15th Electronics Packaging Technology Conference (EPTC 2013)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPTC.2013.6745799","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 7

Abstract

With the growing demand for electronic devices operating in harsh conditions, the interconnect technology for packaging these devices remains an important area of focus to ensure reliable and stable functioning capabilities. Because these devices may experience temperatures that are higher than those encountered by consumer electronic products (e.g. for down-well tools in oil and gas drilling up to 200°C, automotive application up to 400°C), the die attach material has to withstand high temperatures generated during the device functioning, as well as external conditions without affecting the device performance. Conventional solders used in consumer electronic products have melting points lower than the maximum operating temperatures of harsh environment applications, and they are thus not appropriate for use. In contrast, metallurgical systems that can be bonded using the transient liquid phase (TLP) bonding process is a promising solution for high temperature electronic devices due to the following benefits, namely: (1) high quality bond can be formed, (2) a bond can be formed at a temperature much lower than the melting point of the resulting joint. In this paper, the feasibility to bond silver-tin (Ag-Sn) system using the TLP bonding process and use it as a die attach solution for high temperature electronic systems is reported. The advantages Ag-Sn system provides are low bonding temperature, low cost, high de-bonding temperature, and it is also one of the fast inter-diffusion couples. The influence of bonding parameters, such as bonding temperature, bonding force, on the quality of the TLP bond is discussed in order to develop a Ag-rich bond. The joints developed were inspected using X-ray and SEM/EDX, coupled with shear tests performed at room temperature to determine the mechanical strength of the joint. From the bonding studies, a Ag-Sn TLP bond was successfully developed. No occurrence of voids was found in the bonded area, and from the SEM/EDX analysis the joint was comprised of Ag and Ag3Sn intermetallic only, thereby achieving the desired Ag-rich joint. On the other hand, from the mechanical characterisation tests, the shear strength of the Ag-Sn bonded samples was observed to be higher than the minimum strength requirement for high temperature applications. The shear strength also increased with bonding pressure and temperature.
瞬态液相(TLP)键合使用的Sn/Ag多层高温应用
随着在恶劣条件下运行的电子设备的需求不断增长,封装这些设备的互连技术仍然是一个重要的重点领域,以确保可靠和稳定的功能。由于这些设备的温度可能高于消费类电子产品(例如,石油和天然气钻井中的井下工具温度高达200°C,汽车应用温度高达400°C),因此模具附加材料必须承受设备工作过程中产生的高温,以及不影响设备性能的外部条件。消费电子产品中使用的传统焊料的熔点低于恶劣环境应用的最高工作温度,因此不适合使用。相比之下,可以使用瞬态液相(TLP)键合工艺进行键合的冶金系统对于高温电子器件来说是一种很有前途的解决方案,因为它具有以下优点,即:(1)可以形成高质量的键合;(2)可以在远低于所产生的接头熔点的温度下形成键合。本文报道了采用TLP键合工艺键合银锡(Ag-Sn)体系,并将其作为高温电子系统的模具贴附解决方案的可行性。Ag-Sn体系具有成键温度低、成本低、脱键温度高的优点,同时也是一种快速互扩散偶体。讨论了键合温度、键合力等键合参数对TLP键合质量的影响,以制备富银键合。利用x射线和扫描电镜/EDX检查所开发的接头,并在室温下进行剪切测试,以确定接头的机械强度。通过键合研究,成功地建立了Ag-Sn TLP键。结合区域未发现空洞,SEM/EDX分析表明,接头仅由Ag和Ag3Sn金属间化合物组成,从而实现了期望的富银接头。另一方面,从力学表征测试中,观察到Ag-Sn结合样品的剪切强度高于高温应用的最低强度要求。抗剪强度随粘结压力和温度的增加而增加。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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