{"title":"New Testability Measures For High Level Description Of Circuits","authors":"M. Gentil, D. Crestani, A. Rhalibi, C. Durante","doi":"10.1109/ATW.1994.747842","DOIUrl":null,"url":null,"abstract":"This paper proposes high level testabillty measures based on constraints propagation approach and symbolic fault modelling. These measures are compared with some others on a circuit example poinung out their accunacy to show the circuit areas which are difficult to test.","PeriodicalId":217615,"journal":{"name":"The Third Annual Atlantic Test Workshop","volume":"38 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-08-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"The Third Annual Atlantic Test Workshop","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATW.1994.747842","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
This paper proposes high level testabillty measures based on constraints propagation approach and symbolic fault modelling. These measures are compared with some others on a circuit example poinung out their accunacy to show the circuit areas which are difficult to test.