A. Aoai, K. Suzuki, J. Asubar, H. Tokuda, K. Nojima, N. Ishibashi, N. Okada, K. Tadatomo, M. Kuzuhara
{"title":"Characterization of Resistivity and Breakdown Field in Fe-Doped Semi-Insulating Gan Substrates","authors":"A. Aoai, K. Suzuki, J. Asubar, H. Tokuda, K. Nojima, N. Ishibashi, N. Okada, K. Tadatomo, M. Kuzuhara","doi":"10.1109/IMFEDK.2018.8581960","DOIUrl":null,"url":null,"abstract":"In this work, we study the breakdown electric field and resistivity of Fe-doped semi-insulating GaN substrates with various Fe doping concentrations. The substrate with Fe doping concentration of 4×10<sup>20</sup> cm<sup>−3</sup> exhibited an effective lateral breakdown field of 2 MV/cm with a resistivity of more than 10<sup>12</sup>Ωcm. It was found that increasing the Fe concentration was effective to enhance the resistivity and effective lateral breakdown electric field.","PeriodicalId":434417,"journal":{"name":"2018 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK)","volume":"18 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMFEDK.2018.8581960","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
In this work, we study the breakdown electric field and resistivity of Fe-doped semi-insulating GaN substrates with various Fe doping concentrations. The substrate with Fe doping concentration of 4×1020 cm−3 exhibited an effective lateral breakdown field of 2 MV/cm with a resistivity of more than 1012Ωcm. It was found that increasing the Fe concentration was effective to enhance the resistivity and effective lateral breakdown electric field.