New Circuit Topology for System-Level Reliability of GaN

Abstract

To accelerate GaN adoption, beyond-JEDEC system-level reliability should be done to prove the robustness of GaN in applications. In this paper, a new hard switching test vehicle (half-bridge RC load) was proposed & demonstrated to achieve system-like stress, flexibility of acceleration test, low system power consumption with large sample size, easy setup & control which can meet system-level reliability requirement.