Process development of a flip chip in package with anisotropic conductive film (ACF) for lead-free soldering

S. Lim Pei Siang, T. Min, C. Lee
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引用次数: 9

Abstract

In our previous work, we have established a baseline anisotropic conductive adhesive (ACA) assembly process with positive temperature cycling and temperature humidity reliability results. With the experience gained, further work was carried out to assess the compatibility of anisotropic conductive film (ACF) technology for high I/O applications in lead-free soldering conditions. Here, we report the assembly process development of a 13mm /spl times/ 13mm flip chip BGA package using ACF to meet the stringent reflow temperature of 260/spl deg/C, required for lead-free soldering. The effects of bond pressure distribution and alignment accuracy was found to be more critical in this 8mm /spl times/ 8mm test die and 800 flip chip bumps. A three-factor design of experiment (DOE) was carried out to investigate the effects of assembly parameters such as bonding pressure, temperature and time on moisture sensitivity level (MSL) performance reflowed at 260/spl deg/C. Results showed that higher bond force is undesirable and contributes to delamination at critical interfaces. With process optimization, the flip chip BGA with large die and high I/O was able to meet lead-free soldering requirement.
各向异性导电膜(ACF)封装倒装芯片无铅焊接工艺开发
在我们之前的工作中,我们已经建立了一个具有正温度循环和温度湿度可靠性结果的基线各向异性导电胶(ACA)组装工艺。随着经验的积累,进一步的工作是评估各向异性导电膜(ACF)技术在无铅焊接条件下的高I/O应用的兼容性。在这里,我们报告了使用ACF的13mm /spl倍/ 13mm倒装芯片BGA封装的组装工艺开发,以满足无铅焊接所需的严格回流温度260/spl℃。在这个8mm /spl次/ 8mm测试模和800个倒装芯片凸点中,发现键合压力分布和对准精度的影响更为关键。采用三因素试验设计(DOE)研究了粘接压力、温度和时间等装配参数对260/spl℃回流湿敏等级(MSL)性能的影响。结果表明,较高的粘结力是不可取的,并有助于在关键界面上分层。通过工艺优化,大芯片高I/O倒装BGA能够满足无铅焊接要求。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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