Hardware based empirical model for predicting logic soft error cross-section

Abstract

This work presents a technique to estimate logic cross-section using measured single-event transient pulse widths from radiation experiments. The results are verified by comparing against direct measurement of logic cross-section using C-CREST circuit. Since the logic cross-section is extracted based on experimentally measured transients, it includes device/layout level effects and could be used by existing software-based methods to accurately predict logic soft error rate.