J. Le-Coz, P. Flatresse, S. Clerc, M. Belleville, A. Valentian
{"title":"65nm PD-SOI glitch-free Retention Flip-Flop for MTCMOS power switch applications","authors":"J. Le-Coz, P. Flatresse, S. Clerc, M. Belleville, A. Valentian","doi":"10.1109/ICICDT.2011.5783222","DOIUrl":null,"url":null,"abstract":"This work presents a partially depleted Silicon-on-Insulator (PD-SOI) low-static power consumption Retention Flip-Flop (REFF). This flip-flop is designed in order to avoid wake-up transient glitches. In addition specific leakage reduction techniques are used to compensate the extra leakage currents induced by the SOI floating body effects. This leads to a static power consumption reduced by 2 for only 6% of extra silicon area, compared to a regular floating body implementation.","PeriodicalId":402000,"journal":{"name":"2011 IEEE International Conference on IC Design & Technology","volume":"122 3S1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-05-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 IEEE International Conference on IC Design & Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICICDT.2011.5783222","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
This work presents a partially depleted Silicon-on-Insulator (PD-SOI) low-static power consumption Retention Flip-Flop (REFF). This flip-flop is designed in order to avoid wake-up transient glitches. In addition specific leakage reduction techniques are used to compensate the extra leakage currents induced by the SOI floating body effects. This leads to a static power consumption reduced by 2 for only 6% of extra silicon area, compared to a regular floating body implementation.