K. Seo, J. H. Yang, J. Yoo, H. Hwang, K. Chang, C. H. Shim, S. K. Lee, C. Cho, Y. Kim, B. H. Lee
{"title":"Barrier height reconfiguration of graphene/ZnO:N barristor using ferroelectric polymer","authors":"K. Seo, J. H. Yang, J. Yoo, H. Hwang, K. Chang, C. H. Shim, S. K. Lee, C. Cho, Y. Kim, B. H. Lee","doi":"10.1109/IPFA.2016.7564293","DOIUrl":null,"url":null,"abstract":"We demonstrate and explain the operation of PVDF-TrFE/graphene/ZnO:N barristor using electrostatic force microscopy (EFM) poling system. The device was successfully reconfigured using a ferroelectric polymer, PVDF-TrFE. ~103 of device current modulation were achieved. And, it will be very useful for dynamically reconfigurable logic, memory and logic-memory hybrid device applications.","PeriodicalId":206237,"journal":{"name":"2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)","volume":"19 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-07-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IPFA.2016.7564293","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
We demonstrate and explain the operation of PVDF-TrFE/graphene/ZnO:N barristor using electrostatic force microscopy (EFM) poling system. The device was successfully reconfigured using a ferroelectric polymer, PVDF-TrFE. ~103 of device current modulation were achieved. And, it will be very useful for dynamically reconfigurable logic, memory and logic-memory hybrid device applications.