qATG: Automatic Test Generation for Quantum Circuits

Chen-Hung Wu, Cheng-Yun Hsieh, Jiun-Yun Li, C. Li
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引用次数: 2

Abstract

Researchers now use randomized benchmarking or quantum volume to test quantum circuits (QC) in the laboratory. However, these tests are long and their fault coverage is unclear. In this paper, we propose behavior fault models based on the function of quantum gates. These fault models are scalable because the number of faults is polynomial, not exponential, to the size of QC. We propose a novel test generation that uses gradient descent to generate test configuration with short length. We revise the chi-square statistical method to decide the number of test repetitions under the specified test escape and overkill. Experimental results on IBM Q systems show that our generated test configurations are effective, and our test lengths are 1,000X shorter than traditional test methods.
量子电路的自动测试生成
研究人员现在使用随机基准或量子体积在实验室中测试量子电路(QC)。然而,这些测试很长,而且它们的错误覆盖范围不清楚。本文提出了基于量子门功能的行为故障模型。这些故障模型是可扩展的,因为故障的数量是QC大小的多项式,而不是指数。提出了一种利用梯度下降生成短长度测试组态的测试生成方法。对卡方统计方法进行了改进,以确定在规定的试验逸出量和过杀量下的试验重复次数。在IBM Q系统上的实验结果表明,我们生成的测试配置是有效的,我们的测试长度比传统的测试方法短1000倍。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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