Improved Ohmic Contact Model for Accurate Simulation of GaN-based HEMTs Using Ensemble Monte Carlo Methods

K. Sakota, K. Herbert, K. Shibata, M. Kuzuhara, K. Kodama, J. Asubar
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Abstract

Ensemble Monte Carlo simulation was performed to simulate the current gain cutoff frequency (fT) of an AlN/GaN HEMT. It was found that the donor density in the source ohmic neutral region should be larger than 5×1020 cm-3 to precisely calculate the drain current. The calculation results indicated that as high as 1.6 THz of fT was achieved with a gate length of 10 nm.
基于集成蒙特卡罗方法的改进欧姆接触模型用于gan基hemt的精确仿真
采用集成蒙特卡罗仿真方法模拟了AlN/GaN HEMT的电流增益截止频率(fT)。结果表明,为了精确计算漏极电流,源欧姆中性区的施主密度应大于5×1020 cm-3。计算结果表明,当栅极长度为10 nm时,可获得高达1.6 THz的fT。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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