K. Sakota, K. Herbert, K. Shibata, M. Kuzuhara, K. Kodama, J. Asubar
{"title":"Improved Ohmic Contact Model for Accurate Simulation of GaN-based HEMTs Using Ensemble Monte Carlo Methods","authors":"K. Sakota, K. Herbert, K. Shibata, M. Kuzuhara, K. Kodama, J. Asubar","doi":"10.1109/IMFEDK56875.2022.9975422","DOIUrl":null,"url":null,"abstract":"Ensemble Monte Carlo simulation was performed to simulate the current gain cutoff frequency (f<inf>T</inf>) of an AlN/GaN HEMT. It was found that the donor density in the source ohmic neutral region should be larger than 5×10<sup>20</sup> cm<sup>-3</sup> to precisely calculate the drain current. The calculation results indicated that as high as 1.6 THz of f<inf>T</inf> was achieved with a gate length of 10 nm.","PeriodicalId":162017,"journal":{"name":"2022 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK)","volume":"22 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-11-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMFEDK56875.2022.9975422","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Ensemble Monte Carlo simulation was performed to simulate the current gain cutoff frequency (fT) of an AlN/GaN HEMT. It was found that the donor density in the source ohmic neutral region should be larger than 5×1020 cm-3 to precisely calculate the drain current. The calculation results indicated that as high as 1.6 THz of fT was achieved with a gate length of 10 nm.