S. Pendharkar, R. Teggatz, J. Devore, J. Carpenter, T. Efland, C. Tsai
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引用次数: 47
Abstract
A novel lateral power device structure with a very high degree of ESD (electrostatic discharge) robustness is presented. This device called the SCR-LDMOS is a modification of the lateral LDMOSFET with good on state and blocking characteristics.