A roaming memory test bench for detecting particle induced SEUs

Abstract

In this paper, we propose a memory based test bench able to record soft errors that may occur to modern circuits in a certain environment. This system allows a good flexibility from different points of view. It is conceived to be modular, programmable, low power consuming and portable. Consequently, it can operate in various experimental conditions such as under artificial sources of particles as well as in natural ambience, from the earth surface to spatial environment.