Generalization of independent faults for transition faults

Abstract

Independent faults were shown to he effective in computing small test sets for stuck-at faults. An efficient procedure for computing a maximal set of independent stuck-at faults is proposed. The notion of independent faults is then extended to other fault models, specifically, transition faults, that require two-pattern tests. Experimental results are presented to show that the computation of independent faults can be practically performed.<>