System-level SRAM yield enhancement

F. Kurdahi, A. Eltawil, Young-Hwan Park, R. Kanj, S. Nassif
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引用次数: 34

Abstract

It is well known that SRAM constitutes a large portion of modern integrated circuits, with 80% or more of the total transistors being dedicated to SRAM in a typical processor or SOC. Thus yield management of these SRAMs plays a crucial role in insuring design success. This paper demonstrates analysis techniques to model and improve the yield of SRAMs at the system level by proper accounting for the coupling between the algorithms targeted for an SOC and the performance, power, and yield of SRAMs used in implementing the algorithms. It is shown that coupling the algorithm and SRAM design phases provides significant advantages over independent optimization
系统级SRAM成品率提高
众所周知,SRAM构成了现代集成电路的很大一部分,在典型的处理器或SOC中,80%或更多的晶体管专用于SRAM。因此,这些sram的良率管理在确保设计成功方面起着至关重要的作用。本文通过适当考虑SOC目标算法与实现算法时使用的sram的性能、功率和产量之间的耦合,演示了在系统级建模和提高sram产量的分析技术。结果表明,与独立优化相比,将算法与SRAM设计阶段相结合具有显著的优势
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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