{"title":"Measurement and simulation of junction to board thermal resistance and its application in thermal modeling","authors":"B. Joiner, V. Adams","doi":"10.1109/STHERM.1999.762450","DOIUrl":null,"url":null,"abstract":"The junction-to-board thermal resistance, /spl theta//sub JB/ or theta JB, is a figure of merit for the thermal performance of surface mount integrated circuit packages relative to the printed circuit board temperature. The determination of /spl theta//sub JB/ by measurement or simulation is described. Examples of the use of /spl theta//sub JB/ in thermal modeling are provided along with estimates of anticipated accuracy. This model provides substantial accuracy improvements over estimates of thermal performance based on junction-to-ambient thermal resistance.","PeriodicalId":253023,"journal":{"name":"Fifteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (Cat. No.99CH36306)","volume":"610 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-03-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"21","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Fifteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (Cat. No.99CH36306)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/STHERM.1999.762450","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 21
Abstract
The junction-to-board thermal resistance, /spl theta//sub JB/ or theta JB, is a figure of merit for the thermal performance of surface mount integrated circuit packages relative to the printed circuit board temperature. The determination of /spl theta//sub JB/ by measurement or simulation is described. Examples of the use of /spl theta//sub JB/ in thermal modeling are provided along with estimates of anticipated accuracy. This model provides substantial accuracy improvements over estimates of thermal performance based on junction-to-ambient thermal resistance.