{"title":"Strength Reliability for Surfaces micro-machined Polycrystalline silicon Micro-Cantilevers","authors":"Jiang Li-li, Tang Jie-ying","doi":"10.1109/ICEPT.2005.1564631","DOIUrl":null,"url":null,"abstract":"MEMS components failure often happens where environment effects, such as shock, vibration, and temperature cycles. In this paper, the reliability of surfaces micro-machined polycrystalline silicon micro-cantilevers under shock loads was discussed. Using interference theory of stress and strength in the mechanical field, the reliability model was presented and it can predict the probability of the reliability of the cantilever under shock loads. It will help improve the design of MEMS","PeriodicalId":234537,"journal":{"name":"2005 6th International Conference on Electronic Packaging Technology","volume":"72 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2005-08-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2005 6th International Conference on Electronic Packaging Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICEPT.2005.1564631","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
MEMS components failure often happens where environment effects, such as shock, vibration, and temperature cycles. In this paper, the reliability of surfaces micro-machined polycrystalline silicon micro-cantilevers under shock loads was discussed. Using interference theory of stress and strength in the mechanical field, the reliability model was presented and it can predict the probability of the reliability of the cantilever under shock loads. It will help improve the design of MEMS