Syntheses and characterizations of a controlled thermally degradable epoxy resin system for electronic packaging

Haiying Li, Lejun Wang, C. Wong
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Abstract

In flip-chip technology, reworkable underfill development has been key to the recovery of highly integrated board assembly designs by replacing defective chips. This paper reports the synthesis, formulation and characterization of two new diepoxides containing secondary and tertiary ester linkages that are thermally degradable below 300/spl deg/C. The secondary and tertiary ester diepoxides were synthesized in three and two steps, respectively. The compounds were characterized via NMR and FTIR spectroscopy, and formulated into underfills with anhydride hardener and imidazole catalyst. A dual-epoxy system was also formulated using tertiary ester diepoxide and an aliphatic diepoxide, ERG-4221E, with the same hardener and catalyst. The curing kinetics were studied by DSC. Thermal properties of cured samples were studied by DSC, TGA and thermomechanical analysis (TMA). The dual-epoxy system showed a viscosity of 18.7, and 0.87 Poise at 25/spl deg/C and 190/spl deg/C, respectively. The cured secondary, tertiary and dual-epoxy formulas showed decomposition temperatures around 265/spl deg/C, 190/spl deg/C and 220/spl deg/C, glass transition temperatures (T/sub g/) around 120-140/spl deg/C, 110-157/spl deg/C and 140-157/spl deg/C, and CTE of 70 ppm//spl deg/C, 72 ppm//spl deg/C and 64 ppm//spl deg/C below their T/sub g/, respectively. The shear strength of the cured dual-epoxy system decreased quickly upon being aged at 230/spl deg/C. Reworkability tests showed that removal from the board of a chip underfilled with this material was easy and the board residue could be removed with a mechanical brush without obvious damage to the solder mask. In summary, the synthesized tertiary epoxide can be used as a reworkable underfill for flip-chip applications.
电子封装用可控热降解环氧树脂体系的合成与表征
在倒装芯片技术中,通过替换有缺陷的芯片,可重复的下填充开发是恢复高集成电路板组装设计的关键。本文报道了两种新型二氧化物的合成、配方和表征,它们含有二级和三级酯键,在300/spl℃以下可热降解。二级酯和叔酯二氧化物分别用三步和两步合成。通过核磁共振和红外光谱对化合物进行了表征,并以酸酐硬化剂和咪唑催化剂配制成底填料。在相同的硬化剂和催化剂下,用二氧化叔酯和脂肪族二氧化二酯(ERG-4221E)配制了双环氧体系。用DSC对固化动力学进行了研究。采用DSC、TGA和热分析(TMA)对固化样品的热性能进行了研究。在25/spl℃和190/spl℃条件下,双环氧体系的粘度分别为18.7和0.87 Poise。固化后的二、三、双环氧树脂的分解温度分别为265、190、220,玻璃化转变温度分别为120 ~ 140、110 ~ 157、140 ~ 157,CTE分别低于T/ g/ 70、72、64 ppm//spl。固化后的双环氧体系在230/spl℃时效后抗剪强度迅速下降。可返工性测试表明,用这种材料填充的芯片很容易从电路板上去除,并且可以用机械刷去除电路板残留物,而不会明显损坏阻焊片。综上所述,合成的叔环氧化物可以用作倒装芯片应用的可重复使用的下填料。
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