Low-CTE materials for printed wiring boards

T. M. Krziwanek
{"title":"Low-CTE materials for printed wiring boards","authors":"T. M. Krziwanek","doi":"10.1109/ISAOM.2001.916571","DOIUrl":null,"url":null,"abstract":"This paper looks at the approaches of a printed wiring board producer to the challenges of stress-free bare-die assembly and increased reliability. The results of this investigation show that reducing the CTE of PWB base materials is a very effective way to increase the reliability of PWBs. Depending on the application, it may be enough to reduce the CTE in the plane of the board for better interconnection reliability between the PWB and surface-mounted devices. This can be done by using standard materials for the major part of the multilayer and materials with alternative reinforcements for the outer layers. Even better reliability can be attained by building the whole multilayer with materials with low CTE properties in all three dimensions. Current developments in telecommunication, automotive and other markets will raise demand for PWBs with higher component density and reliability. Therefore, low-CTE applications will gain in importance. The development of new materials and further development of new concepts for build-up PWBs is the answer to these challenges. This process has already been started and several products are available, but there is still much work to be done.","PeriodicalId":321904,"journal":{"name":"Proceedings International Symposium on Advanced Packaging Materials Processes, Properties and Interfaces (IEEE Cat. No.01TH8562)","volume":"3 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2001-03-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings International Symposium on Advanced Packaging Materials Processes, Properties and Interfaces (IEEE Cat. No.01TH8562)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISAOM.2001.916571","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 7

Abstract

This paper looks at the approaches of a printed wiring board producer to the challenges of stress-free bare-die assembly and increased reliability. The results of this investigation show that reducing the CTE of PWB base materials is a very effective way to increase the reliability of PWBs. Depending on the application, it may be enough to reduce the CTE in the plane of the board for better interconnection reliability between the PWB and surface-mounted devices. This can be done by using standard materials for the major part of the multilayer and materials with alternative reinforcements for the outer layers. Even better reliability can be attained by building the whole multilayer with materials with low CTE properties in all three dimensions. Current developments in telecommunication, automotive and other markets will raise demand for PWBs with higher component density and reliability. Therefore, low-CTE applications will gain in importance. The development of new materials and further development of new concepts for build-up PWBs is the answer to these challenges. This process has already been started and several products are available, but there is still much work to be done.
用于印刷线路板的低cte材料
本文着眼于印刷线路板生产商的方法,以应对无应力裸模组装和提高可靠性的挑战。研究结果表明,降低印制板基材的CTE是提高印制板可靠性的有效途径。根据不同的应用,降低电路板平面上的CTE可能就足够了,以获得更好的PWB与表面安装设备之间的互连可靠性。这可以通过对多层的主要部分使用标准材料和外层使用替代增强材料来完成。通过在所有三个维度上使用低CTE性能的材料来构建整个多层,可以获得更好的可靠性。目前电信、汽车和其他市场的发展将提高对具有更高组件密度和可靠性的pcb的需求。因此,低cte应用将变得越来越重要。开发新材料和进一步开发用于组装PWBs的新概念是应对这些挑战的答案。这个过程已经开始,有几个产品可用,但仍有很多工作要做。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信