S. Pozder, R. Chatterjee, A. Jain, Zhihong Huang, R.E. Jones, E. Acosta
{"title":"Progress of 3D Integration Technologies and 3D Interconnects","authors":"S. Pozder, R. Chatterjee, A. Jain, Zhihong Huang, R.E. Jones, E. Acosta","doi":"10.1109/IITC.2007.382393","DOIUrl":null,"url":null,"abstract":"Three dimensional stacked circuits having multiple active semiconductor levels rely on the development of strata bonding, micro connects between strata, through strata vias (TSV) and a wafer thinning process. Progress in the each of these process technologies for 3D strata stacking is opening the path to more robust and capable 3D process integrations.","PeriodicalId":403602,"journal":{"name":"2007 IEEE International Interconnect Technology Conferencee","volume":"2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-06-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"55","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 IEEE International Interconnect Technology Conferencee","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IITC.2007.382393","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 55
Abstract
Three dimensional stacked circuits having multiple active semiconductor levels rely on the development of strata bonding, micro connects between strata, through strata vias (TSV) and a wafer thinning process. Progress in the each of these process technologies for 3D strata stacking is opening the path to more robust and capable 3D process integrations.