The Optimized Monolithic Fault Protection Circuit for the Soft-shutdown behavior of 600V PT-IGBT by employing a New Blanking Filter

Abstract

We have proposed an optimization method of fault protection circuit, which uses the floating p-well voltage detection, of IGBT by employing a novel blanking filter. The floating p-well capacitor and gate resistor, which filter the false detection during the normal switching period, cause the pull-down MOSFET to lower the gate voltage of the IGBT softly. The experimental results show the soft-shutdown behavior of the IGBT with the optimized protection circuit during the fault condition. We have also investigated the switching characteristics by using the measurement and 2-dimensional numerical simulation