Combine Micro-probing and ORBICH to Catch Non-recognizable Fault in RF and Mixed-Mode Integrated Circuits

Abstract

Fhis paper is to present a novel methodology to overcome above hardness, and two case study are brought out to demonstrate the application. In our methodology, no any new instrument was needed but only through these already accomplished EFA/PFA equipments. The key consideration to develop such ideas were due to keeping testability and effectiveness in these conventional tools for focusing on the capabilities of a foundry's available production.