{"title":"Relevant Signals and Devices for Failure Analysis of Analog and Mixed-signal Circuits","authors":"T. Melis, E. Simeu, L. Saury, E. Auvray","doi":"10.1109/ITC50571.2021.00033","DOIUrl":null,"url":null,"abstract":"Finding critical nodes and devices inside a circuit is important to have a reliable and safe circuit. It is also a necessary information to successfully solve a failure analysis. Besides, this is a difficult task when dealing with analog and mixed signal circuits for safety applications. For complex designs, the list of signals that influences a selected output is not easy to be deduced. This paper proposes a solution to meet these needs. It is a method that is potentially opened to a broader application domain than failure analysis. The obtained results are encouraging and show the advantages of such approach.","PeriodicalId":147006,"journal":{"name":"2021 IEEE International Test Conference (ITC)","volume":"44 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE International Test Conference (ITC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ITC50571.2021.00033","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Finding critical nodes and devices inside a circuit is important to have a reliable and safe circuit. It is also a necessary information to successfully solve a failure analysis. Besides, this is a difficult task when dealing with analog and mixed signal circuits for safety applications. For complex designs, the list of signals that influences a selected output is not easy to be deduced. This paper proposes a solution to meet these needs. It is a method that is potentially opened to a broader application domain than failure analysis. The obtained results are encouraging and show the advantages of such approach.