Effect of /spl gamma/-radiation on the transition layer in metal-semiconductor contacts

A. Belyaev, G. E. Chaika, I. Il’in, R. Konakova, V. Lyapin, V.V. Milenin, O.E. Rengevych, E. Soloviev, M. Tagaev, D.I. Voitsikhovskiy
{"title":"Effect of /spl gamma/-radiation on the transition layer in metal-semiconductor contacts","authors":"A. Belyaev, G. E. Chaika, I. Il’in, R. Konakova, V. Lyapin, V.V. Milenin, O.E. Rengevych, E. Soloviev, M. Tagaev, D.I. Voitsikhovskiy","doi":"10.1109/SMICND.1998.732366","DOIUrl":null,"url":null,"abstract":"An effect of /spl gamma/-radiation on atomic diffusion in the metal-semiconductor heterostructures is considered theoretically. Diffusion of impurities into the transition layer results in the potential redistribution between the depletion and the transition layers. An excess current through the barrier via an \"intermediate\" level occurs. The calculated results are compared with the experimental data.","PeriodicalId":406922,"journal":{"name":"1998 International Semiconductor Conference. CAS'98 Proceedings (Cat. No.98TH8351)","volume":"423 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1998-10-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1998 International Semiconductor Conference. CAS'98 Proceedings (Cat. No.98TH8351)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SMICND.1998.732366","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

An effect of /spl gamma/-radiation on atomic diffusion in the metal-semiconductor heterostructures is considered theoretically. Diffusion of impurities into the transition layer results in the potential redistribution between the depletion and the transition layers. An excess current through the barrier via an "intermediate" level occurs. The calculated results are compared with the experimental data.
/spl γ辐射对金属-半导体触点过渡层的影响
从理论上考虑了/spl γ /-辐射对金属-半导体异质结构中原子扩散的影响。杂质向过渡层的扩散导致损耗层和过渡层之间的电位再分布。过量电流通过“中间”电平通过势垒发生。计算结果与实验数据进行了比较。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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